Search results for key=Ban2000 : 1 match found.

Ph.D. Theses

2000

@phdthesis{Ban2000,
	vgclass =	{thesis},
	author =	{Ravi Bansal},
	title =	{Information Theoretic Integrated Segmentation and
	Registration of Dual {2D} Portal Images and {3D} {CT} Images},
	school =	{Departments of Diagnostic Radiology and Electrical
	Engineering, Yale School of Medicine, Yale University},
	address =	{Brady Memorial Laboratory Room 332, 310 Cedar Street, PO
	Box 208042, New Haven, CT 06520-8042, USA},
	month =	{May},
	year =	{2000},
	url =	{http://noodle.med.yale.edu/thesis/bansal.html},
	url1 =	{http://noodle.med.yale.edu/thesis/bansal.pdf},
	abstract =	{This thesis develops an information theoretic registration
	framework where the segmentation and registration of dual
	anterior-posterior and left lateral portal images to a treatment
	planning three-dimensional computed tomography (CT) image is carried
	out simultaneously and iteratively. The proposed registration framework
	is termed the minimax entropy registration framework as it has two
	steps, the max step and the min step. Appropriate entropies are
	evaluated in each step in order to segment the portal images (the max
	step) and to estimate the registration parameters (the min step). The
	registration framework is based on the intuition that if some structure
	can be segmented in the portal image, the segmented structure, in
	addition to the gray-scale pixel intensity information, can be used to
	better estimate the registration parameters. On the other hand, given
	an estimate of the registration parameters, information from the high
	resolution 3D CT image dataset can be used to guide segmentation of the
	portal images. Performance analysis and comparisons to other
	registration methods demonstrates the robustness and accuracy of the
	proposed registration framework. 

	To further improve the estimated segmentation of the portal images and
	the accuracy of the estimated registration parameters, correlation
	among the image pixel intensities is modeled using a one-dimensional
	Markov random process. Line processes are incorporated in the Markov
	random process model which estimate the edges between the segmented
	regions. As a future research direction, we propose to incorporate the
	estimated edges in the min step to further improve the registration.
	The proposed framework is independent of the image dataset and hence,
	in general, can be straightforwardly extended to register any low
	resolution, low contrast image to a high resolution, high contrast
	image.},
}